Accession Number : AD0626182

Title :   PRODUCTION ENGINEERING MEASURE TYPE 2N2762 FAMILY SILICON ALLOY TRANSISTOR.

Descriptive Note : Final rept. 22 Jun 63-25 Nov 65,

Corporate Author : WESTINGHOUSE ELECTRIC CORP PHILADELPHIA PA

Personal Author(s) : Pisarcik,R. J. ; Priest,J. ; Harm,R.

Report Date : 25 NOV 1965

Pagination or Media Count : 190

Abstract : Data are presented that illustrate an improvement in the secondary breakdown characteristics of the device due to the improved method of junction termination. Improved handling of base assembly and reduction in the thickness of the molybdenum mounting disc are two process improvements developed independently of the contract program but included as additional steps toward reliability improvement. Critical control of the starting material during Phase III of the production run illustrated a definite improvement in the distribution of higher voltage devices. The results presented for the high temperature step-stress test program illustrate an improvement in the reliability of devices fabricated using techniques refined during the course of the contract program when compared to those fabricated using standard procedures. (Author)

Descriptors :   (*TRANSISTORS, MANUFACTURING), SILICON, RELIABILITY(ELECTRONICS), PROCESSING, QUALITY CONTROL, ENCAPSULATION, SOLDERING, DIFFUSION, THICKNESS, MOLYBDENUM

Subject Categories : Electrical and Electronic Equipment
      Fabrication Metallurgy

Distribution Statement : APPROVED FOR PUBLIC RELEASE