Accession Number : AD0627342

Title :   QUANTITATIVE TEXTURE MEASUREMENTS ON EVAPORATED FILMS,

Corporate Author : PITMAN-DUNN RESEARCH LABS FRANKFORD ARSENAL PHILADELPHIA PA

Personal Author(s) : Witt,Fred ; Vook,Richard W. ; Schwartz,Milton E.

Report Date : 29 JUN 1965

Pagination or Media Count : 8

Abstract : A method is described for determining pole figures from thin films which are still attached to their substrates. The usual correction formulas take into account absorption and change in diffracting volume as the thin film rotates in the X-ray beam. Additional correction formulas are derived which take into account the X-ray scattering from and attenuation in the substrate. The technique is demonstrated for a highly oriented 885 A gold film deposited on a thin optical glass substrate. (Author)

Descriptors :   (*FILMS, SYMMETRY(CRYSTALLOGRAPHY)), (*SYMMETRY(CRYSTALLOGRAPHY), GOLD), VAPOR PLATING, SUBSTRATES, CORRECTIONS, X RAY DIFFRACTION

Subject Categories : Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE