Accession Number : AD0631972
Title : MICROCIRCUIT RELIABILITY PREDICTION METHODS.
Descriptive Note : Research rept. for Jul 65-Feb 66,
Corporate Author : NAVY ELECTRONICS LAB SAN DIEGO CALIF
Personal Author(s) : DEAN,H. F.
Report Date : 11 MAR 1966
Pagination or Media Count : 15
Abstract : A survey of possible test methods, and some exploratory work, showed that the most promising methods for the reliability screening of microcircuits are conventional electrical tests; special electrical tests such as rf noise measurement and use of the ring-counter technique; infrared temperature measurement; and visual inspection. (Author)
Descriptors : (*MICROELECTRONICS, *RELIABILITY(ELECTRONICS)), CIRCUITS, TEST METHODS, NOISE(RADIO), MEASUREMENT, COUNTING METHODS, INFRARED RADIATION, TEMPERATURE, VISUAL INSPECTION
Subject Categories : Electrical and Electronic Equipment
Mfg & Industrial Eng & Control of Product Sys
Distribution Statement : APPROVED FOR PUBLIC RELEASE