Accession Number : AD0631972

Title :   MICROCIRCUIT RELIABILITY PREDICTION METHODS.

Descriptive Note : Research rept. for Jul 65-Feb 66,

Corporate Author : NAVY ELECTRONICS LAB SAN DIEGO CALIF

Personal Author(s) : DEAN,H. F.

Report Date : 11 MAR 1966

Pagination or Media Count : 15

Abstract : A survey of possible test methods, and some exploratory work, showed that the most promising methods for the reliability screening of microcircuits are conventional electrical tests; special electrical tests such as rf noise measurement and use of the ring-counter technique; infrared temperature measurement; and visual inspection. (Author)

Descriptors :   (*MICROELECTRONICS, *RELIABILITY(ELECTRONICS)), CIRCUITS, TEST METHODS, NOISE(RADIO), MEASUREMENT, COUNTING METHODS, INFRARED RADIATION, TEMPERATURE, VISUAL INSPECTION

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE