Accession Number : AD0633051

Title :   DIFFUSE DOUBLE DIFFRACTION OF X-RAYS.

Descriptive Note : Technical rept.,

Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE DEPT OF METALLURGY

Personal Author(s) : Strong,S. L. ; Kaplow,Roy

Report Date : 06 APR 1966

Pagination or Media Count : 25

Abstract : A Monte Carlo method has been used to evaluate the magnitude of twice scattered x-rays in diffraction experiments. The quantitative effects of variations in the primary scattering distribution, the absorption coefficient, the scattering power of the atoms, the x-ray wavelength, the specimen thickness, the monochromator and slit configuration and of polarization corrections have been derived. These factors have various influences on the magnitude and angular distribution of the twice scattered radiation.

Descriptors :   (*X RAY DIFFRACTION, *MONTE CARLO METHOD), DIFFUSION, SCATTERING, ATOMIC PROPERTIES

Subject Categories : Metallurgy and Metallography
      Crystallography
      Atomic and Molecular Physics and Spectroscopy

Distribution Statement : APPROVED FOR PUBLIC RELEASE