Accession Number : AD0634034
Title : STUDIES, RESEARCH AND INVESTIGATIONS OF THE OPTICAL PROPERTIES OF THIN FILMS OF METALS SEMI-CONDUCTORS AND DIELECTRICS.
Descriptive Note : Semi-annual rept. no. 11, 16 Aug 64-15 Feb 65,
Corporate Author : COLORADO STATE UNIV FORT COLLINS DEPT OF PHYSICS
Personal Author(s) : Hadley,Lawrence N.
Report Date : 15 FEB 1965
Pagination or Media Count : 12
Abstract : The primary emphasis was further work on films of chromium with hope for an understanding of the reasons for the failure of the method of determining optical constants from measurements of reflectance, transmittance and thickness in the case of chromium. No solution was found, but the investigations yielded some information. X-ray diffraction analysis of Cr films showed a preferred orientation of the Cr on quartz. Only the (110) line of Cr could be observed on the spectrogoniometer. Either this makes Cr lattice spacings fit quartz more closely, or possibly this gives the greatest population density. A Cr film evaporated to a thickness of 1000 A on quartz at 500 C in 1/2 second was found to have a crystallite size of 190 A plus or minus 10 A. An effort was also made to push the measurements of the optical constants of TiO2 out to the IR and UV by use of the curves. The same difficulties in determining n and k occurred as previously. (Author)
Descriptors : (*METAL FILMS, OPTICAL PROPERTIES), (*DIELECTRIC FILMS, OPTICAL PROPERTIES), (*SEMICONDUCTING FILMS, OPTICAL PROPERTIES), CHROMIUM, REFLECTIVITY, X RAY DIFFRACTION, CRYSTAL LATTICES, TITANIUM COMPOUNDS, OXIDES
Subject Categories : Metallurgy and Metallography
Solid State Physics
Distribution Statement : APPROVED FOR PUBLIC RELEASE