Accession Number : AD0636678

Title :   THE PHOTOVOLTAIC METHOD OF MEASURING THE SPECIFIC RESISTANCE OF EPITAXIAL LAYERS.

Corporate Author : FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s) : Piotrowski, K. ; Swiderski,J.

Report Date : 26 MAY 1966

Pagination or Media Count : 8

Descriptors :   (*SEMICONDUCTING FILMS, ELECTRICAL RESISTANCE), (*NONDESTRUCTIVE TESTING, SEMICONDUCTING FILMS), PHOTOCONDUCTIVITY, TEST METHODS, USSR

Subject Categories : Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE