Accession Number : AD0638450

Title :   RESEARCH ON ANISOTROPY IN POLYCRYSTALLINE DIELECTRIC MATERIALS.

Descriptive Note : Final rept., 19 Apr 65-19 May 66.

Corporate Author : MELPAR INC FALLS CHURCH VA

Personal Author(s) : Rice,Donald H. ; Stowe,Richard W.

Report Date : AUG 1966

Pagination or Media Count : 93

Abstract : This report covers the continuation of studies of dielectric anisotropy found in polycrystalline ceramic bodies. During this program, some of the mechanisms contributing to dielectric anisotropy were investigated. Specifically, these were: (1) preferred orientation of component crystals, (2) residual stresses in the crystal lattice, and (3) density gradients in the materials. X-ray diffraction techniques were used to characterize the materials in terms of preferred orientation and internal stress and these characteristics were correlated with the dielectric properties of those materials in order to evaluate the contributory effects of those characteristics to dielectric anisotropy. It was shown that preferred orientation was the major factor in dielectric anisotropy observed in ceramic bodies. (Author)

Descriptors :   (*ANISOTROPY, *DIELECTRICS), (*CERAMIC MATERIALS, ANISOTROPY), CRYSTALLOGRAPHY, DIELECTRIC PROPERTIES, X RAY DIFFRACTION

Subject Categories : Ceramics, Refractories and Glass
      Crystallography
      Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE