Accession Number : AD0640894

Title :   PRODUCTION ENGINEERING MEASURE FOR SILICON NPN SWITCHING TRANSISTORS.

Descriptive Note : Quarterly progress rept. no. 4, 25 Feb-25 May 66,

Corporate Author : MOTOROLA INC PHOENIX ARIZ SEMICONDUCTOR PRODUCTS DIV

Personal Author(s) : Siegel,Mark ; Freese,Jack

Report Date : 25 MAY 1966

Pagination or Media Count : 32

Abstract : Areas of progress during the quarter were as follows: (1) Incoming material specification change to substrate resistivity of 0.01 to 0.02 ohm/cm and breakdown voltage range of 80 to 100 volts has been approved and specifications issued. (2) New diffusion experiments to test narrower basewidths have been initiated. (3) Evaluation probe limits were adjusted and specifications issued. (4) New 10-mil-mask evaluation has been initiated. (5) A new Motorola photoresist is now under evaluation. (6) The cause of stress failures in environmental testing has been determined and appropriate measures were initiated to eliminate the failure mode. (7) Metallization amounts have been standardized and specifications issued. (8) A new cascade rinse facility is now in production use. (Author)

Descriptors :   (*SILICON, *TRANSISTORS), (*MANUFACTURING, TRANSISTORS), (*SEMICONDUCTOR DEVICES, SWITCHING CIRCUITS)

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE