Accession Number : AD0642112

Title :   RELIABILITY SCREENING USING INFRARED RADIATION.

Descriptive Note : Final technical rept., Jun 64-May 66,

Corporate Author : SYLVANIA ELECTRIC PRODUCTS INC WOBURN MASS SEMICONDUCTOR DIV

Personal Author(s) : Selikson,Bernard ; DiMauro,Joseph

Report Date : OCT 1966

Pagination or Media Count : 132

Abstract : A program was conducted to determine the feasibility of developing a process whereby transistors which have a high probability of failing during their lifetime can be screened from a lot of similiar but reliable transistors on the basis of their infrared output while operating under normal electrical conditions. The report includes discussions of the mode of operation of the infrared instrumentation used in the program and details of the life tests which were conducted. (Author)

Descriptors :   (*TRANSISTORS, *RELIABILITY(ELECTRONICS)), (*NONDESTRUCTIVE TESTING, INFRARED RADIATION), INFRARED EQUIPMENT, SEMICONDUCTOR DEVICES, INTEGRATED CIRCUITS

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE