Accession Number : AD0643229

Title :   TRANSMISSION ELECTRON MICROSCOPY OF THIN GLASS SAMPLES.

Descriptive Note : Technical rept.,

Corporate Author : HARVARD UNIV CAMBRIDGE MASS CRUFT LAB

Personal Author(s) : Seward,T. P. ; Uhlmann,D. R. ; Turnbull,D. ; Pierce,G. R.

Report Date : SEP 1966

Pagination or Media Count : 28

Abstract : Two techniques for preparing thin glass samples for direct transmission electron microscopy, viz. mechanical thinning and fracturing are discussed. A modification of the Doherty and Leombruno procedure for mechanically thinning ceramic materials is described. These techniques make possible more reliable electron microscope studies of fine scale submicrostructure in glass systems. Electron microscope observations on fused silica, an alkali-borosilicate glass, and some binary silicate glasses are reported and discussed in terms of our present understanding of glass structure. (Author)

Descriptors :   (*GLASS, *ELECTRON MICROSCOPY), PREPARATION, CERAMIC MATERIALS, SILICON COMPOUNDS, OXIDES, SILICATES, CRYSTAL SUBSTRUCTURE

Subject Categories : Ceramics, Refractories and Glass
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE