Accession Number : AD0644195

Title :   RELIABILITY IN MICROELECTRONICS,

Corporate Author : ROME AIR DEVELOPMENT CENTER GRIFFISS AFB N Y

Personal Author(s) : Brauer,Joseph B.

Report Date : OCT 1966

Pagination or Media Count : 14

Abstract : The paper reviews the current and anticipated future reliability requirements for microelectronic devices and compares these to the present reliability levels. The 'quality problem' as it affects reliability is discussed in some detail. Data is derived from various equipment development programs and investigations of integrated circuit quality and reliability. In recognition of the fact that the produce (microelectronic devices) does not yet meet the 'promise,' some of the problems and interim solutions are discussed in detail. The effectiveness of various acceptance and screening procedures for integrated circuits is evaluated. (Author)

Descriptors :   (*MICROELECTRONICS, *RELIABILITY(ELECTRONICS)), QUALITY CONTROL, INTEGRATED CIRCUITS

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE