Accession Number : AD0644198
Title : MICROELECTRONIC STUDIES, TASK 1. FEASIBILITY STUDY OF EMPIRICAL SCREENING METHODS, TASK 2. MODELING OF TRANSIENT BEHAVIOR.
Descriptive Note : Final rept. 25 Jun 65-25 Mar 66,
Corporate Author : BATTELLE MEMORIAL INST COLUMBUS OHIO COLUMBUS LABS
Personal Author(s) : Peralta,B. C. ; Klapheke,J. W. ; Timberlake,A. B. ; Kopp,C. G. ; Easterday,J. L.
Report Date : 25 MAR 1966
Pagination or Media Count : 194
Abstract : Screening techniques were studied which were potentially useful for silicon integrated circuits. Based on experiments with simple NOR gates, parameters measuring low-frequency noise and transfer characteristics appear to be feasible. Certain transient parameters were developed and studied for potential screening. The purpose was to extend the parameters to another type of circuit and determine whether a correlation existed between assumed changes in the internal parameters of a NOR gate and resulting changes of the 'characteristic parameters.' (Author)
Descriptors : (*MICROELECTRONICS, *INTEGRATED CIRCUITS), RELIABILITY(ELECTRONICS), FAILURE(ELECTRONICS), TRANSIENTS, SILICON, PERFORMANCE(ENGINEERING)
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE