Accession Number : AD0645480

Title :   PRODUCTION ENGINEERING MEASURE: HIGH SPEED SEMICONDUCTOR SWITCH (TWO TERMINAL) AND HIGH SPEED SEMICONDUCTOR SWITCH (GATE).

Descriptive Note : Quarterly rept. no. 13, 29 May-29 Aug 66,

Corporate Author : MOTOROLA INC PHOENIX ARIZ SEMICONDUCTOR PRODUCTS DIV

Personal Author(s) : Bravo,Jerry

Report Date : SEP 1966

Pagination or Media Count : 37

Abstract : The report presents the results obtained from quality control testing of the three-terminal device, the results of investigating the curing procedures for the two-terminal and 2N1765 devices, and the evaluation of wafer resistivity and thickness for optimum turn-on time of the 2N1765 device. (Author)

Descriptors :   (*SEMICONDUCTOR DEVICES, MANUFACTURING), (*ELECTRONIC SWITCHES, SEMICONDUCTOR DEVICES), GATES(CIRCUITS), SILICON CONTROLLED RECTIFIERS, QUALITY CONTROL, AGING(MATERIALS), TRANSISTORS

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE