Accession Number : AD0645664

Title :   IMPROVED HIGH-SPEED INFRARED MAPPING FOR RELIABILITY ASSESSMENT OF MICROCIRCUITRY.

Descriptive Note : Research and development rept. Feb 65-Apr 66,

Corporate Author : NAVY ELECTRONICS LAB SAN DIEGO CALIF

Personal Author(s) : Dean,H. F.

Report Date : 01 SEP 1966

Pagination or Media Count : 48

Abstract : Describes modifications to equipment and improved capability in IR mapping since first-generation system described in NEL Report 1272. High-resolution test mappings were successfully made at map-to-object magnifications up to 144x, in 3 minutes, and at environmental temperatures of 45 C to 55 C. (Author)

Descriptors :   (*MICROELECTRONICS, *RELIABILITY(ELECTRONICS)), (*INFRARED IMAGES, MICROELECTRONICS), CIRCUITS, INFRARED RADIATION, NONDESTRUCTIVE TESTING

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE