Accession Number : AD0647600

Title :   PHYSICAL EVALUATION OF THIN FILMS OF SOLID STATE MATERIALS.

Descriptive Note : Final rept., 1 Dec 65-30 Nov 66,

Corporate Author : MANLABS INC CAMBRIDGE MASS

Personal Author(s) : Peters,Edward T.

Report Date : JAN 1967

Pagination or Media Count : 37

Abstract : Experimental methods include reflection electron diffraction, X-ray diffraction and fluorescent analysis, electron probe microanalysis and light microscopy in addition to the determination of specific properties, such as density, hardness and index of refraction. The materials submitted for analysis include electrodeposits of copper on single crystal copper substrates, vapor deposits of boron phosphide and silicon carbide on selected substrate hosts, high perfection germanium, synthetic and natural spinels and crystals of lithium germanate, calcium tartrate and cuprous chloride. In addition, special services such as crystal orientation and cutting have been performed. (Author)

Descriptors :   (*FILMS, SOLID STATE PHYSICS), PHYSICAL PROPERTIES, CRYSTAL GROWTH, BORON COMPOUNDS, SILICON CARBIDES, ELECTRON DIFFRACTION, X RAY DIFFRACTION, GERMANIUM, COPPER, SPINEL, PHOSPHIDES, LITHIUM COMPOUNDS, GERMANIUM COMPOUNDS, OXIDES

Subject Categories : Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE