Accession Number : AD0649410

Title :   A STROBOSCOPIC SECONDARY-EMISSION ELECTRON MICROSCOPE,

Corporate Author : FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s) : Spivak,G. V. ; Dyukov,V. G. ; Sedov,N. N. ; Nevzorov,A. N.

Report Date : 31 JAN 1967

Pagination or Media Count : 17

Abstract : The purpose of a stroboscopic or gating electron microscope is to observe the successive quasi-instantaneous stages of dynamic processes; if the frequency of the investigated process is synchronized with the gating there will be obtained stationary images of the surface structure regardless of the frequency characteristics of the screen. In the case of an emission system with a three-electrode objective a stroboscopic regime can be realized in different ways: supply of the microscope with high-voltage pulses, modulation of the potential on the focusing electrode, or deflection of the beam by means of appropriate deflecting plates. In the instrument employed in the present work pulse modulation was employed. A block diagram of the microscope and associated electronic equipment is shown in the figure. Some of the parameters of the equipment and particularly of the ion source used for inducing the secondary emission are described in the paper. (Author)

Descriptors :   (*ELECTRON MICROSCOPY, *STROBOSCOPES), ELECTRON MICROSCOPES, OPTICAL IMAGES, MODULATION, SURFACE PROPERTIES, FOCUSING, DEFLECTION, SILICON, DIODES(ELECTRON TUBES), USSR

Subject Categories : Test Facilities, Equipment and Methods
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE