Accession Number : AD0650978

Title :   MULTI-CORE MEMORY MODULE DC TESTER,

Corporate Author : JOHNS HOPKINS UNIV SILVER SPRING MD APPLIED PHYSICS LAB

Personal Author(s) : Locke,C. Douglass

Report Date : 21 JUN 1963

Pagination or Media Count : 53

Abstract : The system described was designed to provide an automatic D.C. testing device for use with the multicore assemblies used in Satellite memory assemblies. Unitl now, these assemblies were tested by hand, a rather cumbersome task. Each assembly consists of from 3 to 160 cores, each with several windings, as well as several common windings which traverse the whole assembly of cores. It is very important that each core have an exact ratio of turns for proper operation, thus, for a D.C. test, the system must be extremely sensitive to small changes in resistance. This unit is designed to test all multicore assemblies by changing a programming panel for each different type. Although somewhat limited in its application, because of the reasons outlined in the summary, it does provide a sensitive resistance check of these assemblied. The report describes its operation as assembled presently. (Author)

Descriptors :   (*MEMORY DEVICES, *TEST SETS), AUTOMATIC, DIRECT CURRENT, DATA STORAGE SYSTEMS, POWER SUPPLIES, VOLTMETERS, SCANNING, RECORDING SYSTEMS, PANEL BOARDS(ELECTRICITY), TEST EQUIPMENT

Subject Categories : Computer Hardware
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE