Accession Number : AD0655397

Title :   PHYSICS OF FAILURE IN ELECTRONICS, VOLUME V,

Corporate Author : BATTELLE MEMORIAL INST COLUMBUS OHIO COLUMBUS LABS

Personal Author(s) : Shilliday,Theodore S. ; Vaccaro,Joseph

Report Date : 1966

Pagination or Media Count : 574

Abstract : The fifth in a series of annual symposia on the Physics of Failure in Electronics convened at Battelle Memorial Institute in Columbus, Ohio, on November 15, 16, and 17, 1966. It was jointly sponsored by Rome Air Development Center and the Battelle-Columbus Laboratories. There were about 535 individuals in attendance, thirty of them from seven foreign countries. Centering almost exclusively on scientific inquiry into material processes and phenomena influencing the degradation and failure of solid state electronic devices and related structures, the Symposium technical program contained two invited papers, twenty-seven contributed papers, and seven late-news papers.

Descriptors :   (*FAILURE(ELECTRONICS), SYMPOSIA), (*RELIABILITY(ELECTRONICS), *TRANSISTORS), SEMICONDUCTOR DEVICES, SURFACE PROPERTIES, DAMAGE, RADIATION EFFECTS, ELECTRONIC EQUIPMENT, DEGRADATION, SILICON, INTEGRATED CIRCUITS

Subject Categories : Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE