Accession Number : AD0661640
Title : NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH.
Descriptive Note : Rept. no. 4, 1 Feb-31 Aug 67,
Corporate Author : MINNESOTA UNIV MINNEAPOLIS ELECTRON TUBE RESEARCH LAB
Personal Author(s) : VAN DER Ziel,A.
Report Date : NOV 1967
Pagination or Media Count : 99
Abstract : Noise measurements in transmission type secondary electron multipliers, image intensifier multipliers and continuous channel electron multipliers indicate that the noise can always be described as the product of the multiplied primary shot noise and a noise deterioration factor. The deterioration factor is comparable in all cases. The first two devices have a linear relative between output and input, but the channel multiplier is nonlinear. One must then distinguish between the true and apparent noise reduction factors. The latter can be quite small and it gives an inflated idea about the multiplier performance. (Author)
Descriptors : (*ELECTRON MULTIPLIERS, NOISE(RADIO)), MEASUREMENT, IMAGE INTENSIFIERS(ELECTRONICS)
Subject Categories : Electrooptical and Optoelectronic Devices
Distribution Statement : APPROVED FOR PUBLIC RELEASE