Accession Number : AD0663233

Title :   ACCURACY OF LATTICE PARAMETER MEASUREMENTS IN A SMALL CRYSTALLOGRAPHIC RESEARCH LABORATORY.

Descriptive Note : Rept. for Jan-Jun 67,

Corporate Author : AEROSPACE CORP EL SEGUNDO CALIF LAB OPERATIONS

Personal Author(s) : Wolten,Gerard M.

Report Date : SEP 1967

Pagination or Media Count : 40

Abstract : An experimental investigation was conducted into the precision and accuracy with which lattice parameters can be determined under realistic operating conditions. The work included precision alignment of x-ray diffractometers. The lattice parameter project of the International Union for Crystallography is described as an introduction to the work. Special problems applying to materials that are highly transparent to x rays are considered. Data reduction by a least-squares computer program is discussed. (Author)

Descriptors :   (*CRYSTAL LATTICES, MEASUREMENT), ACCURACY, LABORATORIES, X RAY DIFFRACTION, LEAST SQUARES METHOD, CRYSTALLOGRAPHY, GRAPHITE, BERYLLIUM COMPOUNDS

Subject Categories : Test Facilities, Equipment and Methods
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE