Accession Number : AD0663233
Title : ACCURACY OF LATTICE PARAMETER MEASUREMENTS IN A SMALL CRYSTALLOGRAPHIC RESEARCH LABORATORY.
Descriptive Note : Rept. for Jan-Jun 67,
Corporate Author : AEROSPACE CORP EL SEGUNDO CALIF LAB OPERATIONS
Personal Author(s) : Wolten,Gerard M.
Report Date : SEP 1967
Pagination or Media Count : 40
Abstract : An experimental investigation was conducted into the precision and accuracy with which lattice parameters can be determined under realistic operating conditions. The work included precision alignment of x-ray diffractometers. The lattice parameter project of the International Union for Crystallography is described as an introduction to the work. Special problems applying to materials that are highly transparent to x rays are considered. Data reduction by a least-squares computer program is discussed. (Author)
Descriptors : (*CRYSTAL LATTICES, MEASUREMENT), ACCURACY, LABORATORIES, X RAY DIFFRACTION, LEAST SQUARES METHOD, CRYSTALLOGRAPHY, GRAPHITE, BERYLLIUM COMPOUNDS
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE