Accession Number : AD0665784

Title :   A METHOD OF FOURIER ANALYSIS OF X-RAY PEAK SHAPES USING ONLY FIRST-ORDER PEAKS.

Descriptive Note : Technical rept.,

Corporate Author : NORTHWESTERN UNIV EVANSTON ILL DEPT OF MATERIALS SCIENCE

Personal Author(s) : Rothman,R. L. ; Cohen,J. B.

Report Date : 22 JAN 1968

Pagination or Media Count : 37

Abstract : A method of Fourier analysis of x-ray line broadening is presented whereby microstrains, incoherent particle sizes, and stacking fault probabilities can be calculated using only first order peaks. This approach also eliminates errors due to peak truncation and provides a method for accurate determinations of integrated intensities. Calculations based on this method are compared to results obtained using the usual method of multiple orders. (Author)

Descriptors :   (*CRYSTAL SUBSTRUCTURE, X RAY DIFFRACTION), (*CRYSTAL DEFECTS, X RAY DIFFRACTION), (*X RAY DIFFRACTION, *FOURIER ANALYSIS), STRAIN(MECHANICS), DISLOCATIONS, GRAIN SIZE, GRAIN STRUCTURES(METALLURGY), CRYOGENICS, ALLOYS

Subject Categories : Physical Chemistry
      Metallurgy and Metallography
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE