Accession Number : AD0680364

Title :   DETERMINATION OF OXYGEN CONTENT IN GERMANIUM AND SILICON BY He3 ION ACTIVATION,

Corporate Author : TRANSTEK ASSOCIATES READING MASS

Personal Author(s) : Aleksandrova,G. I. ; Demidov,A. M. ; Kotelnikov,G. A. ; Pleshakova,G. P. ; Sukhov,G. V.

Report Date : SEP 1968

Pagination or Media Count : 17

Abstract : In connection with the necessity of selecting a material suitable for the manufacture of spectrometric nuclear radiation detectors, a technique has been developed for oxygen determination in germanium and silicon by He3 ion bombardment. The possibility of analysis of gallium arsenide, tungsten, silicon carbide, and other materials is demonstrated. The sensitivity of the method is 0.0000007 percent. (Author)

Descriptors :   (*OXYGEN, *RADIOACTIVATION ANALYSIS), (*SEMICONDUCTORS, IMPURITIES), GERMANIUM, SILICON, ISOTOPES, DECAY SCHEMES, GAMMA RAY SPECTRA, ION BOMBARDMENT, HELIUM, NUCLEAR RADIATION SPECTROMETERS

Subject Categories : Radiation and Nuclear Chemistry
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE