Accession Number : AD0683408

Title :   CORRECTION FACTOR TABLES FOR FOUR-POINT PROBE RESISTIVITY MEASUREMENTS ON THIN, CIRCULAR SEMICONDUCTOR SAMPLES.

Descriptive Note : Technical note,

Corporate Author : NATIONAL BUREAU OF STANDARDS WASHINGTON D C

Personal Author(s) : Swartzendruber,Lydon J.

Report Date : 15 APR 1964

Pagination or Media Count : 43

Abstract : Extensive tables of the geometrical correction factors for four-point probe resistivity measurements on thin, circular semiconductor samples with all surfaces insulating are given, (1) for an in-line probe array displaced radially with points along a diameter, (2) for an in-line probe array displaced radially with the line of points perpendicular to a diameter, and (3) for a displaced square probe array. (Author)

Descriptors :   (*SEMICONDUCTORS, ELECTRICAL RESISTANCE), (*ELECTRICAL RESISTANCE, MEASUREMENT), CYLINDRICAL BODIES, TEST METHODS, TABLES(DATA)

Subject Categories : Test Facilities, Equipment and Methods
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE