Accession Number : AD0683706
Title : HIGH RESOLUTION WITH NONDISPERSIVE X-RAY SPECTROMETERS,
Corporate Author : STANFORD UNIV CALIF HIGH ENERGY PHYSICS LAB
Personal Author(s) : Aitken,D. W.
Report Date : JUL 1968
Pagination or Media Count : 23
Abstract : A research effort was carried out with the aim of acquiring a better understanding of the processes leading to the detection of x rays in silicon and germanium, as well as in alkali halide scintillation crystals. Results of this research, as well as of the work of other groups, new enables one to make a comparison of detectors for high resolution nondispersive x-ray analysis, and to draw some conclusions concerning what to expect in the future. The present article is limited to a discussion of resolution in the x-ray energy region. This region spans the energy range from about 1 keV to 100 keV. This in turn corresponds to the wavelength region extending from about 10 Angstroms down to about 0.1 Angstroms.
Descriptors : (*NUCLEAR RADIATION SPECTROMETERS, RESOLUTION), X RAY SPECTROSCOPY, X RAY DIFFRACTION, IONIZATION CHAMBERS, SILICON, GERMANIUM, SEMICONDUCTOR DEVICES, RESPONSE
Subject Categories : Nuclear Instrumentation
Distribution Statement : APPROVED FOR PUBLIC RELEASE