
Accession Number : AD0685596
Title : RANDOM WEAR MODELS IN RELIABILITY THEORY.
Descriptive Note : Technical rept.,
Corporate Author : FLORIDA STATE UNIV TALLAHASSEE DEPT OF STATISTICS
Personal Author(s) : Reynolds,David S.
Report Date : MAR 1969
Pagination or Media Count : 96
Abstract : Gaver and Antelman and Savage have proposed models for the distribution of the time to failure of a simple device exposed to a randomly varying environment. Each model represents cumulative wear as a specified function of a nonnegative stochastic process X with independent increments, and assumes the reliability of the device is conditioned upon realizations of this process. From these models are derived the corresponding unconditional joint distributions for the random failure time vector of n independent, identical devices exposed simultaneously to the same realization of the wear process. Conditions are given under which both models can give rise to identical onedimensional failure time distributions. Joint failure time distributions are obtained in explicit form and the probabilities of ties and tie configurations are derived. Maximum likelihood estimates are obtained for certain relevant parameters for each of the models when X(t) is a process with stationary nonnegative increments.
Descriptors : (*RELIABILITY, MATHEMATICAL MODELS), STOCHASTIC PROCESSES, FAILURE(MECHANICS), FAILURE(ELECTRONICS), RANDOM VARIABLES, STATISTICAL DISTRIBUTIONS, SPECIAL FUNCTIONS(MATHEMATICAL), LIFE EXPECTANCY
Subject Categories : Mfg & Industrial Eng & Control of Product Sys
Distribution Statement : APPROVED FOR PUBLIC RELEASE