Accession Number : AD0688832

Title :   GENERATION OF DIAGNOSTIC TESTS USING PRIME IMPLICANTS,

Corporate Author : ILLINOIS UNIV URBANA COORDINATED SCIENCE LAB

Personal Author(s) : Paige,Michael Reid

Report Date : MAY 1969

Pagination or Media Count : 43

Abstract : With recent advances in microminiaturization and fabrication techniques, digital computer design has begun to make fuller use of single packages containing many logic gates. This change in design approach has shifted the emphasis in fault testing techniques. Fault Testing is defined here as the process of determining whether or not a package of gates is operating correctly by comparing its output under certain inputs with that of the fault-free machine. It is the purpose of this thesis to present an approach to fault testing using only the prime implicant information provided for the system. This technique is an answer to the question, 'How may fault tests for a given circuit be selected with the minimum of detailed analysis of the logic network.' The number of tests specified by this approach is, in general, much lower than the number of possible input combinations, although it may be higher than the minimum number of tests which could be derived with full, detailed knowledge of the circuit structure. (Author)

Descriptors :   (*DIGITAL COMPUTERS, RELIABILITY(ELECTRONICS)), (*LOGIC CIRCUITS, TEST METHODS), COMPUTER LOGIC, GATES(CIRCUITS), THESES

Subject Categories : Electrical and Electronic Equipment
      Computer Hardware

Distribution Statement : APPROVED FOR PUBLIC RELEASE