Accession Number : AD0694060

Title :   SOFT X-RAY DATA ACQUISITION AND HANDLING.

Descriptive Note : Technical rept. Jan-Dec 68,

Corporate Author : AIR FORCE MATERIALS LAB WRIGHT-PATTERSON AFB OHIO

Personal Author(s) : Baun,William L.

Report Date : AUG 1969

Pagination or Media Count : 31

Abstract : The fine features of x-ray emission spectra, including band shapes and intensities, are being used more and more for identification of unknown materials, especially using the electron microbeam probe. Advances in electronics have facilitated x-ray emission data acquisition and improvements in data handling and computer techniques have allowed curve analysis and data reduction that could not be attempted by hand calculation methods. Data collection systems are described. In one system, the x-ray detector and dispersing crystal are advanced in steps by a precision stepping motor which is interconnected with the stepper control, printing timer, printing scalar, print control, teletype and paper tape output. In another system, a multichannel analyzer is used in a multiscaler mode. In both systems the paper tape is converted to magnetic tape which is fed into the computer and a data sheet for each spectrum is printed. From these data sheets, line or point by point plots, linear in either wavelength or energy, may then be prepared by the computer for any selected spectrum. Examples, using AlK, MgK, and CuL and other spectra, are shown using the systems described above. Aspects such as improvements in curve analysis and the use of wavelength and energy converter modules are discussed. (Author)

Descriptors :   (*X RAY SPECTROSCOPY, DATA PROCESSING), ALUMINUM, CHEMICAL ANALYSIS, COPPER

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE