Accession Number : AD0696987
Title : FIELD ION MICROSCOPY.
Descriptive Note : Final rept. Jun 59-May 69,
Corporate Author : PENNSYLVANIA STATE UNIV UNIVERSITY PARK FIELD EMISSION LAB
Personal Author(s) : Mueller,Erwin W.
Report Date : 30 SEP 1969
Pagination or Media Count : 15
Abstract : The objectives of this project include the development of improved field-ion microscopes, several means of image intensification, and experiments to clarify the physical processes of ion image formation. Applications of field ion microscopy to the study of lattice imperfections and to order-disorder structures of Pt-Co alloys are described. A bibliography containing twenty-five publications and twenty presentations at the annual Field Emission Symposia is given. (Author)
Descriptors : (*MICROSCOPES, IONS), (*FIELD EMISSION, MICROSCOPY), CRYSTAL DEFECTS, IMAGE INTENSIFIERS(ELECTRONICS), PLATINUM ALLOYS, COBALT ALLOYS
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE