Accession Number : AD0697127

Title :   COMPUTER-AIDED TECHNIQUE FOR THE ACCURATE DETERMINATION OF THE SEMICONDUCTOR IMPURITY DOPING PROFILE.

Descriptive Note : Research and development technical rept.,

Corporate Author : ARMY ELECTRONICS COMMAND FORT MONMOUTH N J

Personal Author(s) : Baranowski,Joseph J. ; Higgins,Vincent J.

Report Date : OCT 1969

Pagination or Media Count : 20

Abstract : The basic equations for the determination of semiconductor net impurity doping profiles are derived. A computer technique is introduced which aids the accurate solution of the basic equations. The described method is mathematically rigorous and represents a vast improvement over previously used techniques. (Author)

Descriptors :   (*SEMICONDUCTORS, DOPING), (*DOPING, MATHEMATICAL ANALYSIS), IMPURITIES, NUMERICAL ANALYSIS, DETERMINATION, CONFIGURATION

Subject Categories : Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE