Accession Number : AD0697127
Title : COMPUTER-AIDED TECHNIQUE FOR THE ACCURATE DETERMINATION OF THE SEMICONDUCTOR IMPURITY DOPING PROFILE.
Descriptive Note : Research and development technical rept.,
Corporate Author : ARMY ELECTRONICS COMMAND FORT MONMOUTH N J
Personal Author(s) : Baranowski,Joseph J. ; Higgins,Vincent J.
Report Date : OCT 1969
Pagination or Media Count : 20
Abstract : The basic equations for the determination of semiconductor net impurity doping profiles are derived. A computer technique is introduced which aids the accurate solution of the basic equations. The described method is mathematically rigorous and represents a vast improvement over previously used techniques. (Author)
Descriptors : (*SEMICONDUCTORS, DOPING), (*DOPING, MATHEMATICAL ANALYSIS), IMPURITIES, NUMERICAL ANALYSIS, DETERMINATION, CONFIGURATION
Subject Categories : Solid State Physics
Distribution Statement : APPROVED FOR PUBLIC RELEASE