Accession Number : AD0704855

Title :   A DEVICE FOR INVESTIGATING AND CHECKING THE MAGNETIC MEMORY ELEMENTS OF THIN-FILM MATRICES,

Corporate Author : FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s) : Bekh,A. D. ; Korsunskii,V. M. ; Pavlus,B. I.

Report Date : 19 MAR 1970

Pagination or Media Count : 13

Abstract : A tester has been developed for the quality control of batch-produced memory matrices. Both the thin film and the system of wires are tested. The matrix under test has 36 18-digit words on a 50 x 50-mm backing; first, the matrices are rated, then grouped according to their close ratings, and then tested; this procedure reduces the number of rejects. The minimal sensing signal, minimal write signal, and maximum destruction signal are measured; the latter signal is measured after the information has been written into the test cell by a single pulse while the adjacent elements receive equal pulses of reverse polarity. The tester permits measuring the three above parameters simultaneously in all elements of one digit (place) of the test matrix. The tester (a block diagram shown) is designed with standard thin-film-memory elements.

Descriptors :   (*THIN FILM STORAGE DEVICES, *TEST EQUIPMENT), QUALITY CONTROL, INTEGRATED CIRCUITS, USSR

Subject Categories : Computer Hardware
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE