Accession Number : AD0706826

Title :   NEW INFRARED DETECTOR USING MICROWAVE TECHNIQUES.

Descriptive Note : Technical rept.,

Corporate Author : ARMY ELECTRONICS COMMAND FORT MONMOUTH N J

Personal Author(s) : Locke,Paul A. ; Jacobs,Harold

Report Date : JUN 1970

Pagination or Media Count : 21

Abstract : A device is described whereby reflections from a semiconductor block placed in a waveguide are used to measure the photon flux incident on the semiconductor. A germanium sample with associated circuitry acts as a tuned cavity whereby in the null condition complete absorption occurs. As light changes the semiconductor conductivity, changes in reflected power provide a sensitive indicator. Computer calculations have been worked out in an exact analysis and the results are checked with experiments. As a photo detector, this device may be competitive with state-of-the art components. If used as a research tool to study semiconductor properties the scheme has a great deal of sensitivity and flexibility. (Author)

Descriptors :   (*INFRARED DETECTORS, SEMICONDUCTOR DEVICES), GERMANIUM, SEMICONDUCTORS, DIELECTRICS, PHOTOELECTRIC MATERIALS, PHOTOCONDUCTIVITY, MICROWAVES, TUNING DEVICES

Subject Categories : Infrared Detection and Detectors

Distribution Statement : APPROVED FOR PUBLIC RELEASE