Accession Number : AD0709983

Title :   MILLIMETER AND SUBMILLIMETER WAVE DIELECTRIC MEASUREMENTS WITH AN INTERFERENCE SPECTROMETER.

Descriptive Note : Final rept. 15 Apr 66-14 Apr 70,

Corporate Author : GEORGIA INST OF TECH ATLANTA ENGINEERING EXPERIMENT STATION

Personal Author(s) : McSweeney,Albert ; Sheppard,Albert P.

Report Date : 14 APR 1970

Pagination or Media Count : 65

Abstract : Dielectric constants, loss tangents, and transmission coefficients for a large number of materials were measured in the millimeter and submillimeter wave part of the electromagnetic spectrum. Instrumentation and measurement techniques for obtaining these data are described in detail. These include interference spectroscopy using a black body source with appropriately designed filters, and coherent techniques using a Fabry-Perot interferometer or a short-circuited waveguide filled with powdered samples. The measurements show that many materials commonly employed in the microwave spectrum tend to be very lossy as a function of increasing frequencies toward 2000 GHz (67/cm). Some materials, such as Teflon, polyethylene, Rexolite, and slip-cast fused silica, were observed to have relatively low dissipation factors so as to represent excellent candidates for component and electromagnetic window applications throughout the millimeter and submillimeter wave part of the spectrum. (Author)

Descriptors :   (*DIELECTRICS, EXTREMELY HIGH FREQUENCY), DIELECTRIC PROPERTIES, MEASUREMENT, MILLIMETER WAVES, SUBMILLIMETER WAVES

Subject Categories : Miscellaneous Materials

Distribution Statement : APPROVED FOR PUBLIC RELEASE