Accession Number : AD0710304

Title :   FINAL TECHNICAL REPORT.

Corporate Author : LEHIGH UNIV BETHLEHEM PA

Report Date : 30 JUN 1970

Pagination or Media Count : 66

Abstract : The report covers work done during the past grant period, which included studies of the performance of wide silicon p-i-n diodes and IMPATT diode oscillators, and the development of a microwave noise measuring system. Chapter 1 describes observations of unusual properties of wide p-i-n diodes with respect to transmission of microsecond and submicrosecond pulses and VHF sinusoidal signals. Champter 2 presents a theoretical analysis of the noise generated by a Read diode IMPATT oscillator in the presence of a small but not negligible signal current. The analysis points to a possible method of accounting for nise output in the neighborhood of the signal frequency of such an oscillator. Chapter 3 describes a microwave noise measuring system which is used to measure AM and FM noise spectra of oscillators. Measurement results are given. (Author)

Descriptors :   (*SEMICONDUCTOR DIODES, *NOISE(RADIO)), MICROWAVE OSCILLATORS, MICROWAVE FREQUENCY, SILICON, RELIABILITY(ELECTRONICS), MEASUREMENT

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE