Accession Number : AD0710883

Title :   A TECHNIQUE FOR DIFFERENTIATION OF MAGNETIC AND STRUCTURAL DIFFRACTION EFFECTS IN LORENTZ MICROSCOPY,

Corporate Author : SASKATCHEWAN UNIV SASKATOON COLL OF ENGINEERING

Personal Author(s) : Bowman,M. J. ; Meyer,V. H.

Report Date : 07 NOV 1969

Pagination or Media Count : 3

Abstract : A simple method is presented by which magnetic and structural diffraction effects may be differential when thin ferromagnetic films are viewed under high resolution Lorentz defocused microscopy. The technique utilizes the sense of the electron velocity on the direction of the Lorentz force in the film. (Author)

Descriptors :   (*ELECTRON MICROSCOPY, ANALYSIS), (*NICKEL, MAGNETIC PROPERTIES), (*METAL FILMS, MICROSTRUCTURE), THIN FILM STORAGE DEVICES, DIFFRACTION, RESOLUTION, FILMS, CANADA

Subject Categories : Test Facilities, Equipment and Methods
      Electricity and Magnetism
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE