Accession Number : AD0713910

Title :   Quantitative Phase Analysis and Precise Lattice Parameter Measurements by X-Ray Diffraction,

Corporate Author : BOEING CO RENTON WASH COMMERCIAL AIRPLANE DIV

Personal Author(s) : Olsen,R. H.

Report Date : 23 SEP 1970

Pagination or Media Count : 37

Abstract : The technique developed for quantitative phase analysis involves using the siemens X-Ray Diffractometer and specially designed specimen holder which tilts and rotates the specimen while the intensity profiles from particular diffraction planes are recorded. The intensity profiles are recorded on printed tape and input, along with phase chemistries and crystallographic data, to a computer program XRAY that calculates the necessary intensity factors, integrates the intensity profiles and calculates the volume fraction. Standard methods for retained austenite, and beta analysis in titanium were developed. The procedure for calculating lattice parameters is based on Cohens method of Least Squares analysis. Measured diffraction angles and the corresponding wavelength and hkl are input to computer program XRLP. (Author)

Descriptors :   (*TITANIUM ALLOYS, *X RAY DIFFRACTION), CRYSTAL LATTICES, BETA PARTICLES, AUSTENITE, LEAST SQUARES METHOD, METAL CRYSTALS, TITANIUM

Subject Categories : Metallurgy and Metallography
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE