Accession Number : AD0714157
Title : An Investigation into Redundancy and Testability of Combinational Logic Networks.
Descriptive Note : Technical rept.,
Corporate Author : IOWA UNIV IOWA CITY DEPT OF MATHEMATICS
Personal Author(s) : Dandapani,Ramaswami ; Reddy,Sudhakar M. ; Robinson,John P.
Report Date : SEP 1970
Pagination or Media Count : 29
Abstract : Some results on redundancy and testability of combinational logic networks are given. It is shown that there exist tree networks that are testable relatively easily for redundancy and faults. It is also shown that the multilevel networks proposed not only require less hardware but also fewer tests to detect faults than the equivalent two level networks. (Author)
Descriptors : (*LOGIC CIRCUITS, REDUNDANT COMPONENTS), RELIABILITY(ELECTRONICS), CIRCUITS, FLOW CHARTING, TEST METHODS, MAINTENANCE, EFFICIENCY, COMBINATORIAL ANALYSIS
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE