Accession Number : AD0714567
Title : Content Mapping Techniques for Qualitative and Semiqualitative Analysis with the Electron Microbeam Probe.
Descriptive Note : Technical rept. Oct 69-May 70,
Corporate Author : DAYTON UNIV OHIO RESEARCH INST
Personal Author(s) : Solomon,James S. ; Baun,W. L.
Report Date : SEP 1970
Pagination or Media Count : 28
Abstract : Content mapping of small surface areas with the electron microbeam probe can be used to quickly obtain very effectively both qualitative and quantitative information. An automatic content mapping device is available with the Hitachi Perkin-Elmer XMA-S Electron Probe Micro-analyzer that can cover an area up to 50 microns by 50 microns. Compared with the conventional X-ray image, advantages of content mapping include enhancement of the contrast of the element density distribution for specimens having an enriched element density with slight variation and for specimens under high magnification with poor contrast. The content mapping device is described and examples of content maps of various alloy composition and concentrations are shown. (Author)
Descriptors : (*ELECTRON MICROSCOPY, *PROBES), (*ALLOYS, CHEMICAL ANALYSIS), QUANTITATIVE ANALYSIS, SURFACES, MAPPING, OPERATION, CONCENTRATION(CHEMISTRY), X RAY ABSORPTION ANALYSIS
Subject Categories : Properties of Metals and Alloys
Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE