Accession Number : AD0714831

Title :   Basic Phenomenological Theory of the Optical Properties of Thin Films (Osnovy Fenomenologicheskoi Teorii Opticheskikh Svoistv Tonkikh Pokrytii),

Corporate Author : ARMY FOREIGN SCIENCE AND TECHNOLOGY CENTER WASHINGTON D C

Personal Author(s) : Rozenberg,G. V.

Report Date : 21 OCT 1970

Pagination or Media Count : 42

Abstract : The optical properties of thin films used in interferometry are examined from the viewpoint of phenomenological theory to assist in revealing the nature of the basic optical properties of thin films and in preparing the groundwork for determination of the causes of the numberous anomalies inherent to them. The content of phenomenological theory is calculation of the phase path of a wave propagating within a layer and conditions of reflection on its boundaries. (Author)

Descriptors :   (*INTERFEROMETERS, DIELECTRIC FILMS), (*DIELECTRIC FILMS, OPTICAL PROPERTIES), REFRACTION, REFLECTION, LIGHT TRANSMISSION, METAL FILMS, USSR

Subject Categories : Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE