Accession Number : AD0714903

Title :   Fluorescence Thermography and Current Crowding in High-Frequency Transistor Switches,

Corporate Author : COMMUNICATIONS RESEARCH CENTRE OTTAWA (ONTARIO)

Personal Author(s) : Chudobiak,W. J.

Report Date : 1970

Pagination or Media Count : 5

Abstract : It is shown in this research note that current crowding effects in large-area semiconductor devices can be conveniently studied using temperature-sensitive phosphors. (Author)

Descriptors :   (*TRANSISTORS, RELIABILITY(ELECTRONICS)), (*THERMAL STABILITY, NONDESTRUCTIVE TESTING), ELECTRICAL RESISTANCE, THERMAL ANALYSIS, FLUORESCENCE, ELECTRIC SWITCHES, PHOSPHORESCENT MATERIALS, VERY HIGH FREQUENCY, CANADA

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE