Accession Number : AD0717006

Title :   A Method for Analyzing Image Distortion in Diffraction Topographs,

Corporate Author : BALLISTIC RESEARCH LABS ABERDEEN PROVING GROUND MD

Personal Author(s) : Kingman,P. W.

Report Date : DEC 1970

Pagination or Media Count : 19

Abstract : The geometry of image distortion in diffraction topographs can be analyzed with complete generality by considering the mapping between the topograph and the true surface configuration as an affine transformation on a two dimensional manifold, as described by the relation z to the kth power = ((D sub K) to the kth power) (Z to the Kth power). By analogy with classical finite strain analysis; it is seen that when D is known, the true spatial configuration can always be extracted from the distorted image, and conversely, if the configuration of a set of base vectors in both images is specified, the components of D can be determined. An experimental procedure based upon this analysis has been developed and applied to the identification of multiple slip and kink traces in oblique Berg-Barrett topographs of polished metallographic samples. (Author)

Descriptors :   (*X RAY PHOTOGRAPHY, PHOTOINTERPRETABILITY), (*X RAY DIFFRACTION, METAL CRYSTALS), ALUMINUM, COPPER, DISTORTION, OPTICAL IMAGES

Subject Categories : Photography
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE