Accession Number : AD0717433
Title : LEED Patterns and Surface Perfection.
Descriptive Note : Research rept. 1968-1969,
Corporate Author : POST OFFICE RESEARCH DEPT LONDON (ENGLAND)
Personal Author(s) : Heckingbottom,R.
Report Date : 04 MAR 1969
Pagination or Media Count : 10
Abstract : It is now well established that many types of surface imperfection have only a marginal effect on LEED patterns. This is shown here to be, in many cases, a consequence of the limited coherence width of electrons in typical LEED beams. In the light of these observations, the departures from surface perfection which have a marked effect on LEED patterns, and those that do not, are delineated more clearly than hitherto. (Author)
Descriptors : (*ELECTRON DIFFRACTION, PATTERN RECOGNITION), (*CRYSTAL DEFECTS, SURFACES), GERMANIUM, SILICON, RESOLUTION, GREAT BRITAIN
Subject Categories : Crystallography
Distribution Statement : APPROVED FOR PUBLIC RELEASE