Accession Number : AD0717433

Title :   LEED Patterns and Surface Perfection.

Descriptive Note : Research rept. 1968-1969,

Corporate Author : POST OFFICE RESEARCH DEPT LONDON (ENGLAND)

Personal Author(s) : Heckingbottom,R.

Report Date : 04 MAR 1969

Pagination or Media Count : 10

Abstract : It is now well established that many types of surface imperfection have only a marginal effect on LEED patterns. This is shown here to be, in many cases, a consequence of the limited coherence width of electrons in typical LEED beams. In the light of these observations, the departures from surface perfection which have a marked effect on LEED patterns, and those that do not, are delineated more clearly than hitherto. (Author)

Descriptors :   (*ELECTRON DIFFRACTION, PATTERN RECOGNITION), (*CRYSTAL DEFECTS, SURFACES), GERMANIUM, SILICON, RESOLUTION, GREAT BRITAIN

Subject Categories : Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE