Accession Number : AD0719925

Title :   Quantitative Surface Finish Characterization by CESEMI.

Descriptive Note : Technical rept.,

Corporate Author : PENNSYLVANIA STATE UNIV UNIVERSITY PARK MATERIALS RESEARCH LAB

Personal Author(s) : White,Eugene W. ; McKinstry,Herbert A. ; Diness,Arthur M.

Report Date : 10 MAR 1971

Pagination or Media Count : 27

Abstract : A feasibility for quantitative characterization of surface finishes based on the computer evaluation of scanning electron microscope images (CESEMI) have been established. Measurement of the number, size, shape and orientation of isointensity (or selected intensity interval) regions constitute the basic analysis. Brightness in SEM images varies as a function of the steepness of slope of the surface at a given point. In their analysis, the characteristics of grooves, pits, ridges, etc., can be studied separately. Detailed interpretation of the results are not attempted in this preliminary study. A feasibility for recording and analyzing profilometer rasters have also been demonstrated. Such recordings are, in essence, true three dimensional images of surface topography insofar as the profilometer stylus faithfully follows the surface morphology. Analysis of these profilometer recordings by the basic CESEMI computer programs yield direct descriptions of the topography. The SEM image and profilometer 'image' analyses appear to be complementary techniques. One obvious advantage of the SEM image analysis is that it is a no-contact technique hence, there are no problems introduced by stylus damage. (Author)

Descriptors :   (*FINISHES, ELECTRON MICROSCOPY), (*ELECTRON MICROSCOPY, SURFACE PROPERTIES), PRECISION FINISHING, SURFACE ROUGHNESS, ANALYSIS

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE