Accession Number : AD0723635

Title :   Computer Plotted Soft X-Ray Spectra to Facilitate Chemical Combination Studies with the Electron Microbeam Probe.

Descriptive Note : Technical rept. Mar-Sep 70,

Corporate Author : DAYTON UNIV OHIO RESEARCH INST

Personal Author(s) : Baum,W. L. ; Solomon,J. S.

Report Date : FEB 1971

Pagination or Media Count : 41

Abstract : Changes in fine features of soft x-ray emission spectra due to chemical combination are difficult to measure and compare from the usual ratemeter-analog recording of soft x-ray emission spectra. This method is very tedious, resulting in possible measurement errors and misinterpretation of actual band shapes and changes, especially when x-ray intensities are low. To apply the chemical combination effect techniques to practical analytical use, such as electron microbeam probe analysis, a faster and highly reliable and reproducible method to obtain and analyze the soft x-ray spectra must be employed. With the development in recent years of the Nuclear Instrumentation Modular (NIM) type equipment with digital data output on computer compatible papertape, chemical combination effect techniques can be applied to rapid, practical, and routine analytical use. A system is described that utilizes a time-sharing computer and a plotting teletypewriter to plot the soft x-ray emission spectra from an electron microbeam probe. Data from the papertape is fed to the computer through the plotting teletypewriter and is processed and prepared for plotting in one program. Then the analyst simply calls for the plotting program when his data is ready for plotting and in a matter of minutes he has either a raw data plot or a smoothed, normalized plot. Several plotting options are available that essentially make the plotting teletypewriter an x-y recorder. The smoothed, normalized plots greatly reduce the possibility of error and facilitate measuring changes and comparing spectra. Examples of computer plotted soft x-ray emission spectra are shown along with some specific analytical applications. (Author)

Descriptors :   (*SPECTRUM ANALYZERS, X RAY SPECTROSCOPY), (*CHEMICAL ANALYSIS, X RAY SPECTROSCOPY), DATA PROCESSING, PLOTTERS, X RAY ABSORPTION ANALYSIS, COMPUTER PROGRAMS

Subject Categories : Test Facilities, Equipment and Methods
      Atomic and Molecular Physics and Spectroscopy

Distribution Statement : APPROVED FOR PUBLIC RELEASE