Accession Number : AD0726923

Title :   Conference Proceedings: Component Degradation from Transient Inputs, 28-29 April 1970.

Corporate Author : ARMY MOBILITY EQUIPMENT RESEARCH AND DEVELOPMENT CENTER FORT BELVOIR VA

Report Date : 01 JUL 1971

Pagination or Media Count : 294

Abstract : The proceedings of the conference on 'Component Degradation From Transient Inputs' is presented. The papers given cover the effects of induced electrical transients, as produced by an Electromagnetic Pulse on electronic components. Attention focused on electrical stress degradation and damage on semiconductors. Topics such as thermal damage models, Multiple damage mechanisms, effects of complex waveshapes, synergistic effects, effects on integrated circuitry, and the statistics involved in the characterization of failure are discussed. (Author)

Descriptors :   (*SEMICONDUCTOR DEVICES, TRANSIENTS), FAILURE(ELECTRONICS), SYMPOSIA, SEMICONDUCTORS, ELECTROMAGNETIC PULSES, NUCLEAR EXPLOSIONS, INTEGRATED CIRCUITS, DAMAGE

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE