Accession Number : AD0731817

Title :   Reliability Guidelines for the Procurement and Use of Large Scale Integrated Circuits,

Corporate Author : IIT RESEARCH INST CHICAGO ILL RELIABILITY ANALYSIS CENTER

Personal Author(s) : Myers,Theodore R.

Report Date : DEC 1970

Pagination or Media Count : 97

Abstract : Large Scale Integration (LSI) promises many advantages to the designer of state-of-the-art electronic systems in size, weight, and cost reduction while enhancing performance and reliability. However, successful transition to this new technology presents new challenges. Traditional quality assurance and reliability assessment practices designed around large volume part procurements must be re-examined. Most likely a much closer interface will be established between the vendor and user. The reliability and quality assurance staff is in a unique position to develop and lead this combined effort. Technical Monograph 70-2 develops an approach for a coincident reliability program and considers the reliability impact of processing and design decisions. Expected and observed failure modes and mechanisms, including packaging problems, are discussed. Guidelines are included for a quality assurance program covering process control, screening, and LSI testing. Finally, a method is outlined for predicting LSI component failure rates. (Author)

Descriptors :   (*INTEGRATED CIRCUITS, RELIABILITY(ELECTRONICS)), QUALITY CONTROL, FAILURE(ELECTRONICS), PREDICTIONS, PROCUREMENT

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE