Accession Number : AD0731904
Title : Analysis of the Reliability of Logic Circuits,
Corporate Author : FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OH
Personal Author(s) : Zhetbaeva, N. P. ; Loktionov, A. A.
Report Date : 19 JUL 1971
Pagination or Media Count : 19
Abstract : The study of the reliability of logic circuits with series and parallel connected elements during random malfunctions is given. Generalized failure formulas are obtained for a trigger with a counting input and differentiating elements at the output, and an estimate is made of the reliability of the series circuit of the trigger. The result is compared with an estimate of the reliability of this same circuit obtained by taking catastrophic failures into account. A three input majority circuit with random malfunctions is considered, and generalized failure formulas are obtained for it. An estimate of the reliability of a majority circuit with random malfunctions is compared with an estimate obtained with allowance for catastrophic failures. It is found that in the case of both series and parallel connected elements substantially different results are obtained depending on whether the reliability is calculated with allowance for random malfunctions or catastrophic failures. (Author)
Descriptors : *LOGIC CIRCUITS, RELIABILITY(ELECTRONICS), FAILURE(ELECTRONICS), MALFUNCTIONS, MATHEMATICAL ANALYSIS, PROBABILITY, DIGITAL SYSTEMS, USSR.
Subject Categories : Computer Hardware
Distribution Statement : APPROVED FOR PUBLIC RELEASE