Accession Number : AD0738474
Title : Dielectric Relaxation in Crystalline V2O5.
Descriptive Note : Technical rept.,
Corporate Author : OREGON STATE UNIV CORVALLIS DEPT OF CHEMISTRY
Personal Author(s) : Scott,Allen B. ; Mar,Kenneth M.
Report Date : 29 FEB 1972
Pagination or Media Count : 16
Abstract : The real part of the dielectric constant in crystalline V2O5 has been measured in the temperature range 80K to 200K. It rises from about 5, at low temperature, to about 9 in a narrow temperature range which depends upon frequency. The ac conductivity exceeds the dc conductivity by a measurable amount at low temperature, because of the contribution of relaxation. The crystal behaves approximately as a Debye dielectric. The relaxation time was found as a function of temperature. Two models for dipolar centers are proposed and discussed. (Author)
Descriptors : (*VANADIUM COMPOUNDS, DIELECTRIC PROPERTIES), (*SEMICONDUCTORS, VANADIUM COMPOUNDS), OXIDES, RELAXATION TIME, CRYSTAL GROWTH, TEMPERATURE, SINGLE CRYSTALS
Subject Categories : Solid State Physics
Distribution Statement : APPROVED FOR PUBLIC RELEASE