Accession Number : AD0738649

Title :   Operation of Reliability Analysis Center.

Descriptive Note : Final rept. 15 Sep 70-30 Sep 71,

Corporate Author : IIT RESEARCH INST CHICAGO ILL

Personal Author(s) : Lauffenburger,Harold ; Edfors,Hugh ; Petersen,Barbara

Report Date : JAN 1972

Pagination or Media Count : 121

Abstract : The Reliability Analysis Center is a service for the dissemination of reliability test and experience information on microcircuit devices. This report summarizes accomplishments of the Center during its third full year of operation, covering the period from 1 September 1970 through 30 September 1971. Information is presented on the output products and services, input data acquisitions, and the internal information processing functions. In addition, subscriber status and individual publication sales are documented. The various methods for publicizing RAC services and current efforts directed toward expansion of these services to effect greater utilization of accumulated data resources are discussed. (Author)

Descriptors :   (*INTEGRATED CIRCUITS, RELIABILITY(ELECTRONICS)), TECHNICAL INFORMATION CENTERS, MICROELECTRONICS, INFORMATION RETRIEVAL, DATA PROCESSING, TEST FACILITIES

Subject Categories : Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE