Accession Number : AD0738907

Title :   High-G Testing of Electronic Components.

Descriptive Note : Master's thesis,

Corporate Author : NAVAL POSTGRADUATE SCHOOL MONTEREY CALIF

Personal Author(s) : Miles,Samuel Allen , II

Report Date : JUN 1971

Pagination or Media Count : 75

Abstract : High-g acceleration produced by large bore guns is compared with impact acceleration. Methods for subjecting electronic components and circuit packages to high-g launch environments up to 550,000-g are outlined and analyzed. An analysis of the effect of the high-g environment on components is performed on a component by component basis. Methods for selecting, 'hardening' and testing components for high-g circuitry are given as are circuit construction and assembly details. An extensive appendix listing type, manufacturer and part number is included for components that have survived high-g environmental testing. Recommendations are made for an improved test program that will yield a new generation of reliable high-g hardened components for circuit design. (Author)

Descriptors :   (*ELECTRONIC EQUIPMENT, ENVIRONMENTAL TESTS), (*RELIABILITY(ELECTRONICS), ACCELERATION), ANTENNAS, BATTERY COMPONENTS, ELECTRIC BATTERIES, CAPACITORS, COAXIAL CABLES, ELECTRIC CONNECTORS, SEMICONDUCTOR DEVICES, PRINTED CIRCUITS, INTEGRATED CIRCUITS, COILS, RESISTORS, EMBEDDING SUBSTANCES

Subject Categories : Mfg & Industrial Eng & Control of Product Sys
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE