Accession Number : AD0742237
Title : Operation and Maintenance Manual, Microelectronic Wafer and Integrated Circuit Test Set, TTU-311/E (XV-1).
Descriptive Note : Technical rept. 28 May 70-31 Aug 71.
Corporate Author : RESEARCH TRIANGLE INST DURHAM N C
Report Date : JAN 1972
Pagination or Media Count : 47
Abstract : Procedures are given for operation and maintenance of Test Set TTU-311/E. The Test Set is used as an operator aid in the visual inspection of integrated ciruits on the production line. A functional description is first given, followed by operational procedures. System maintenance procedures are then described. (Author)
Descriptors : (*INTEGRATED CIRCUITS, *TEST SETS), QUALITY CONTROL, INSTRUCTION MANUALS, VISUAL INSPECTION, DAMAGE, RADIATION EFFECTS, MAINTENANCE
Subject Categories : Electrical and Electronic Equipment
Mfg & Industrial Eng & Control of Product Sys
Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE