Accession Number : AD0742237

Title :   Operation and Maintenance Manual, Microelectronic Wafer and Integrated Circuit Test Set, TTU-311/E (XV-1).

Descriptive Note : Technical rept. 28 May 70-31 Aug 71.

Corporate Author : RESEARCH TRIANGLE INST DURHAM N C

Report Date : JAN 1972

Pagination or Media Count : 47

Abstract : Procedures are given for operation and maintenance of Test Set TTU-311/E. The Test Set is used as an operator aid in the visual inspection of integrated ciruits on the production line. A functional description is first given, followed by operational procedures. System maintenance procedures are then described. (Author)

Descriptors :   (*INTEGRATED CIRCUITS, *TEST SETS), QUALITY CONTROL, INSTRUCTION MANUALS, VISUAL INSPECTION, DAMAGE, RADIATION EFFECTS, MAINTENANCE

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE